Publications

Showing results for "yoon" 1-23 of 23

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Wafer-scale selective-area deposition of nanoscale metal oxide features using vapor saturation into patterned poly(methyl methacrylate) templates Advanced Materials Interfaces, 3(2). Dandley, E. C., Lemaire, P. C., Zhu, Z. W., Yoon, A., Sheet, L., & Parsons, G. N. 2016
The five parameter grain boundary character distribution of polycrystalline silicon Journal of Materials Science, 49(14), 4938-4945. Ratanaphan, S., Yoon, Y., & Rohrer, G. S. 2014
Epitaxial growth of three-dimensionally mesostructured single-crystalline Cu2O via templ-ated electrodeposition Chemistry of Materials, 26(24), 7051-7058. Kim, J., Kim, H. S., Choi, J. H., Jeon, H., Yoon, Y., Liu, J., Park, J. G., & Braun, P. V. 2014
Interband transitions and dielectric functions of InGaSb alloys Applied Physics Letters, 102(10). Kim, T. J., Yoon, J. J., Byun, J. S., Hwang, S. Y., Aspnes, D. E., Shin, S. H., Song, J. D., Liang, C. T., Chang, Y. C., Barange, N. S., Kim, J. Y., & Kim, Y. D. 2013
Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model Thin Solid Films, 547, 276-279. Hwang, S. Y., Kim, T. J., Byun, J. S., Barange, N. S., Diware, M. S., Kim, Y. D., Aspnes, D. E., Yoon, J. J., & Song, J. D. 2013
Titanium-enriched hydroxyapatite-gelatin scaffolds with osteogenically differentiated progenitor cell aggregates for calvaria bone regeneration Tissue Engineering. Part A, 19(15-16), 1803-1816. Ferreira, J. R., Padilla, R., Urkasemsin, G., Yoon, K., Goeckner, K., Hu, W. S., & Ko, C. C. 2013
Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers Journal of the Electrochemical Society, 159(2), H125-H129. Kulshreshtha, P. K., Yoon, Y., Youssef, K. M., Good, E. A., & Rozgonyi, G. 2012
Effect of nickel contamination on high carrier lifetime n-type crystalline silicon Journal of Applied Physics, 111(3). Yoon, Y., Paudyal, B., Kim, J., Ok, Y. W., Kulshreshtha, P., Johnston, S., & Rozgonyi, G. 2012
Effect of nickel contamination on high carrier lifetime n-type crystalline silicon (vol 111, 033702, 2012) Journal of Applied Physics, 111(4). Yoon, Y., Paudyal, B., Kim, J., Ok, Y. W., Kulshreshtha, P., Johnston, S., & Rozgonyi, G. 2012
Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon Applied Physics Letters, 101(22). Yoon, Y., Yan, Y. X., Ostrom, N. P., Kim, J., & Rozgonyi, G. 2012
Effect of nickel contamination on high carrier lifetime n-type crystalline silicon (vol 111, 033702, 2012) Journal of Applied Physics, 111(4). Yoon, Y., Paudyal, B., Kim, J., Ok, Y. W., Kulshreshtha, P., Johnston, S., & Rozgonyi, G. 2012
Dielectric functions and interband transitions of In1-xAlxSb alloys Applied Physics Letters, 97(11). Yoon, J. J., Kim, T. J., Jung, Y. W., Aspnes, D. E., Kim, Y. D., Kim, H. J., Chang, Y. C., Shin, S. H., & Song, J. D. 2010
Microstructure and electrical properties of high power laser thermal annealing on inkjet-printed Ag films Microelectronic Engineering, 87(11), 2230-2233. Yoon, Y. H., Yi, S. M., Yim, J. R., Lee, J. H., Rozgonyi, G., & Joo, Y. C. 2010
Interband transitions of InAsxSb1-x alloy films Applied Physics Letters, 95(11). Kim, T. J., Yoon, J. J., Hwang, S. Y., Aspnes, D. E., Kim, Y. D., Kim, H. J., Chang, Y. C., & Song, J. D. 2009
Optical properties of InxAl1-xAs alloy films Applied Physics Letters, 92(15). Yoon, J. J., Ghong, T. H., Byun, J. S., Kim, Y. D., Aspnes, D. E., Kim, H. J., Chang, Y. C., & Song, J. D. 2008
Model dielectric functions for AlxGa1-xAs alloys of arbitrary compositions Journal of Applied Physics, 104(1). Jung, Y. W., Kim, T. J., Yoon, J. J., Kim, Y. D., & Aspnes, D. E. 2008
Analysis of interface layers by spectroscopic ellipsometry Applied Surface Science, 255(3), 640-642. Kim, T. J., Yoon, J. J., Kim, Y. D., Aspnes, D. E., Klein, M. V., Ko, D. S., Kim, Y. W., Elarde, V. C., & Coleman, J. J. 2008
Thickness dependence of submicron thick Pb(Zr0.3Ti0.7)O-3 films on piezoelectric properties Ceramics International, 34(8), 1909-1915. Kim, D. J., Park, J. H., Shen, D., Lee, J. W., Kingon, A. I., Yoon, Y. S., & Kim, S. H. 2008
Electrical properties of Pb1-xLax(ZryTi1-y)(1-x/4)O-3 thin films with various iridium-based top electrodes Integrated Ferroelectrics, 33(1-4), 155-164. Yoon, S. G., Kingon, A. I., & Kim, S. H. 2001
Effect of hydrogen on true leakage current characteristics of (Pb,La)(Zr,Ti)O-3 thin-film capacitors with Pt- or Ir-based top electrodes Journal of Materials Research, 16(4), 1185-1189. Yoon, S. G., Wicaksana, D., Kim, D. J., Kim, S. H., & Kingon, A. I. 2001
Recovery characteristics of hydrogen-damaged (Pb,La)(Zr,Ti)O-3 capacitors with Pt and IrO2 top electrodes Journal of the Electrochemical Society, 148(7), F137-F139. Yoon, S. G., & Kingon, A. I. 2001
Relaxation and leakage current characteristics of Pb1- xLax(ZryTi1-y)(1-x/4)O3 thin films with various Ir-based top electrodes Journal of Applied Physics, 88(11), 6690-6695. Yoon, S. G., Kingon, A. I., & Kim, S. H. 2000
Dependence of the C49-C54 TiSi(2) phase transition temperature on film thickness and Si substrate orientation Thin Solid Films, 299(1-2), 178-182. Jeon, H.-T., Yoon, G.-J., & Nemanich, R. J. 1997

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