Publications

Showing results for "salmon" 1-8 of 8

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Morphological analysis of GeTe in inline phase change switches Journal of Applied Physics, 118(9). King, M. R., El-Hinnawy, N., Salmon, M., Gu, J., Wagner, B. P., Jones, E. B., Borodulin, P., Howell, R. S., Nichols, D. T., & Young, R. M. 2015
Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes Scanning, 25(1), 45-51. Bender, J. W., Salmon, M. E., & Russell, P. E. 2003
Self-healing on OPA self-assembled monolayers Nanotechnology, 12(3), 285-289. Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. 2001
Spread coating of OPA on mica: From multilayers to self- assembled monolayers Langmuir, 17(26), 8193-8198. Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. 2001
Thermal stability study of self-assembled monolayers on mica Langmuir, 16(6), 2409-2412. Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. 2000
Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. (2000). Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy. In D. B. Williams & R. Shimizu (Eds.) Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. (pp. 367-368). Bristol: Institute of Physics Publishing. Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. 2000
Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate Microscopy and Microanalysis, 5(6), 413-419. Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. 1999
Observation of topography inversion in atomic force microscopy of self-assembled monolayers Nanotechnology, 10(4), 399-404. Neves, B. R. A., Leonard, D. N., Salmon, M. E., Russell, P. E., & Troughton, E. B. 1999

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