Publications

Showing results for "russell" 1-25 of 36 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26 6) (pp. 2168-2173). Dhawan, A., Muth, J. F., Leonard, D. N., Gerhold, M. D., Gleeson, J., Vo-Dinh, T., & Russell, P. E. 2008
Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current Applied Physics Letters, 92(24). Progl, C. L., Parish, C. M., Vitarelli, J. P., & Russell, P. E. 2008
Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry Microscopy and Analysis, 86, 5-6. A.D. Garetto, R.R. Garcia, A.D. Batchelor, C.L. Progl, D.P. Griffis and P.E. & Russell. 2007
Scanning cathodoluminescence microscopy Advances in Imaging and Electron Physics, 147, 1-135. Parish, C. M., & Russell, P. E. 2007
On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data Applied Physics Letters, 89(19). Parish, C. M., & Russell, P. E. 2006
Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN/GaN quantum-well light-emitting diode Applied Physics Letters, 86(8). Bunker, K. L., Garcia, R., & Russell, P. E. 2005
Circuit editing of copper and low-k dielectrics in nanotechnology devices Journal of Microscopy, 214(2004 Jun), 246-251. Mosselveld, F., Makarov, V. V., Lundquist, T. R., Griffis, D. P., & Russell, P. E. 2004
High efficiency GaN-based LEDs and lasers on SiC Journal of Crystal Growth, 272(04-Jan), 242-250. Edmond, J., Abare, A., Bergman, M., Bharathan, J., Bunker, K. L., Emerson, D., Haberern, K., Ibbetson, J., Leung, M., Russell, P., & Slater, D. 2004
Etching characteristics of chromium thin films by an electron beam induced surface reaction Semiconductor Science and Technology, 18(4), 199-205. Wang, J. H., Griffis, D. P., Garcia, R., & Russell, P. E. 2003
Chemically enhanced focused ion beam micro-machining of copper Patent:
Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C. (2003). Chemically enhanced focused ion beam micro-machining of copper. U.S. Patent No. 6,514,866. Washington, DC: U.S. Patent and Trademark Office. Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C.
2003
Chemically enhanced focused ion beam micro-machining of copper Patent:
Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C. (2003). Chemically enhanced focused ion beam micro-machining of copper. U.S. Patent No. 6,645,872. Washington, DC: U.S. Patent and Trademark Office. Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C.
2003
Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes Scanning, 25(1), 45-51. Bender, J. W., Salmon, M. E., & Russell, P. E. 2003
Electrical characterization of InGaN quantum well p-n heterostructures Microelectronics Journal, 34(5-8), 455-457. Gonzalez, J. C., Da Silva, M. I. N., Bunker, K. L., Batchelor, A. D., & Russell, P. E. 2003
Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures Microelectronics Journal, 34(5-8), 571-573. Da Silva, M. I. N., Gonzalez, J. C., & Russell, P. E. 2003
Improvements in focused ion beam micromachining of interconnect materials Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(6), 2700-2704. Gonzalez, J. C., Da Silva, M. I. N., Griffis, D. P., & Russell, P. E. 2002
Multiscale dewetting of low-molecular-weight block copolymer ultrathin films Macromolecular Rapid Communications, 23(3), 205-209. Leonard, D. N., Russell, P. E., Smith, S. D., & Spontak, R. J. 2002
Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM Polymer, 43(25), 6719-6726. Leonard, D. N., Spontak, R. J., Smith, S. D., & Russell, P. E. 2002
Supporting lab report writing in an introductory materials engineering lab Wiebe, E. N., Hare, T. M., Carter, M., Fahmy, Y., Russell, R., & Ferzli, M. (2001). Supporting lab report writing in an introductory materials engineering lab. In 2001 ASEE annual conference & exposition: Proceedings ; June 24-27, 2001, Albuquerque Convention Center, Albuquerque, New Mexico. Washington, DC: ASEE. Wiebe, E. N., Hare, T. M., Carter, M., Fahmy, Y., Russell, R., & Ferzli, M. 2001
Chemically enhanced focused ion beam micromachining of copper Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 19(6), 2539-2542. Gonzalez, J. C., Griffis, D. P., Miau, T. T., & Russell, P. E. 2001
Minority-carrier diffusion length in a GaN-based light-emitting diode Applied Physics Letters, 79(10), 1567-1569. Gonzalez, J. C., Bunker, K. L., & Russell, P. E. 2001
Self-healing on OPA self-assembled monolayers Nanotechnology, 12(3), 285-289. Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. 2001
Spread coating of OPA on mica: From multilayers to self- assembled monolayers Langmuir, 17(26), 8193-8198. Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. 2001
Defect-dependent elasticity: Nanoindentation as a probe of stress state Journal of Materials Research, 15(8), 1693-1701. Jarausch, K. F., Kiely, J. D., Houston, J. E., & Russell, P. E. 2000
Channeling effects during focused-ion-beam micromachining of copper Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1061-1065. Phillips, J. R., Griffis, D. P., & Russell, P. E. 2000
Method for water vapor enhanced charged-particle-beam machining Patent:
Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (2000). Method for water vapor enhanced charged-particle-beam machining. U.S. Patent No. 6,140,655. Washington, DC: U.S. Patent and Trademark Office. Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J.
2000

North Carolina State University