Publications

Showing results for "miraglia" 1-19 of 19

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Growth and characterization of ZnO thin films on GaN epilayers Journal of Electronic Materials, 33(7), 826-832. Smith, T. P., McLean, H. A., Smith, D. J., Miraglia, P. Q., Roskowski, A. M., & Davis, R. F. 2004
Electron energy distribution during high-field transport in AlN Journal of Applied Physics, 93(5), 2765-2771. Collazo, R., Schlesser, R., Roskowski, A., Miraglia, P., Davis, R. F., & Sitar, Z. 2003
Helical-type surface defects in GaN thin films epitaxially grown on GaN templates at reduced temperatures Journal of Crystal Growth, 253(1-4), 16-25. Miraglia, P. Q., Preble, E. A., Roskowski, A. M., Einfeldt, S., & Davis, R. F. 2003
Helical-type surface defects in InGaN thin films epitaxially grown on GaN templates at reduced temperatures Thin Solid Films, 437(37623), 140-149. Miraglia, P. Q., Preble, E. A., Roskowski, A. M., Einfeldt, S., Lim, S. H., Liliental-Weber, Z., & Davis, R. F. 2003
Evolution and growth of ZnO thin films on GaN(0001) epilayers via metalorganic vapor phase epitaxy Journal of Crystal Growth, 257(3/4), 255-262. Smith, T. P., Mecouch, W. J., Miraglia, P. Q., Roskowski, A. M., Hartlieb, P. J., & Davis, R. F. 2003
Domain structures in 6H-SiC wafers and their effect on the microstructures of GaN films grown on AlN and Al0.2Ga0.8N buffer layers Journal of Crystal Growth, 258(1/2), 75-83. Preble, E. A., Miraglia, P. Q., Roskowski, A. M., Vetter, W. M., Dudley, M., & Davis, R. F. 2003
Gallium nitride and related materials: challenges in materials processing Acta Materialia, 51(19), 5961-5979. Davis, R. F., Einfeldt, S., Preble, E. A., Roskowski, A. M., Reitmeier, Z. J., & Miraglia, P. Q. 2003
Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor- cleaned GaN thin films Journal of Applied Physics, 91(4), 2133-2137. Preble, E. A., Tracy, K. M., Kiesel, S., McLean, H., Miraglia, P. Q., Nemanich, R. J., Davis, R. F., Albrecht, M., & Smith, D. J. 2002
Growth and decomposition of bulk GaN: role of the ammonia/nitrogen ratio Journal of Crystal Growth, 236(4), 529-537. Shin, H., Arkun, E., Thomson, D. B., Miraglia, P., Preble, E., Schlesser, R., Wolter, S., Sitar, Z., & Davis, R. F. 2002
Maskless pendeo-epitaxial growth of GaN films Journal of Electronic Materials, 31(5), 421-428. Roskowski, A. M., Preble, E. A., Einfeldt, S., Miraglia, P. M., & Davis, R. F. 2002
Surface instability and associated roughness during conventional and pendeo-epitaxial growth of GaN(0001) films via MOVPE Journal of Crystal Growth, 241(1-2), 141-150. Roskowski, A. M., Miraglia, P. Q., Preble, E. A., Einfeldt, S., & Davis, R. F. 2002
Investigations regarding the maskless pendeo-epitaxial growth of GaN films prior to coalescence IEEE Journal of Quantum Electronics, 38(8), 1006-1016. Roskowski, A. M., Preble, E. A., Einfeldt, S., Miraglia, P. M., & Davis, R. F. 2002
Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiG-based, cross-sectional TEM samples Ultramicroscopy, 92(3-4), 265-271. Preble, E. A., McLean, H. A., Kiesel, S. M., Miraglia, P., Albrecht, M., & Davis, R. F. 2002
Reduction in dislocation density and strain in GaN thin films grown via maskless pendeo-epitaxy Opto-electronics Review, 10(4), 261-270. Roskowski, A. M., Preble, E. A., Einfeldt, S., Miraglia, P. M., Schuck, J., Grober, R., & Davis, R. F. 2002
Polarization charges and polarization-induced barriers in AlxGa1-xN/GaN and InyGa1-yN/GaN heterostructures Applied Physics Letters, 79(18), 2916-2918. Jia, L., Yu, E. T., Keogh, D., Asbeck, P. M., Miraglia, P., Roskowski, A., & Davis, R. F. 2001
Strain and dislocation reduction in maskless pendeo-epitaxy GaN thin films Physica Status Solidi. A, Applications and Materials Science, 188(2), 729-732. Roskowski, A. M., Miraglia, P. Q., Preble, E. A., Einfeldt, S., Stiles, T., Davis, R. F., Schuck, J., Grober, R., & Schwarz, U. 2001
Characterization of gradients in mechanical properties of SA- 533B steel welds using ball indentation International Journal of Pressure Vessels and Piping, 76(6), 361-369. Murty, K. L., Miraglia, P. Q., Mathew, M. D., Shah, V. N., & Haggag, F. M. 1999
Compressive mechanical behavior of nanocrystalline Fe investigated with an automated ball indentation technique Materials Science & Engineering. A, Structural Materials: Properties, Microstructure and Processing, 252(1), 36-43. Malow, T. R., Koch, C. C., Miraglia, P. Q., & Murty, K. L. 1998
Indentation-Energy-to-Fracture (IEF) parameter for characterization of DBTT in carbon steels using nondestructive Automated Ball Indentation (ABI) technique Scripta Materialia, 38(4), 645-651. Haggag, F. M., Byun, T. S., Hong, J. H., Miraglia, P. Q., & Murty, K. L. 1998

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