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The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.
|Modeling and characterization of atomically sharp "perfect" Ge/SiO2 interfaces||Materials Science & Engineering. B, Solid-state Materials for Advanced Technology, 114-15(Dec 15 2004), 156-161.||2004|
|Z-contrast imaging of dislocation cores at the GaAs/Si interface||Applied Physics Letters, 81(15), 2728-2730.||2002|