Showing results for "loesing" 1-4 of 4
The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.
|Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O-2(+), and CsC6- primary ion beams||Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(2), 507-511.||2002|
|Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon||Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(1), 509-513.||2000|
|Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants||Hunter, J. L., Bates, T. B., Patel, S. B., Loesing, R., Guraynov, G., & Griffis, D. P. (2000). Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants. In D. B. Williams & R. Shimizu (Eds.) Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. (pp. 327-328). Bristol: Institute of Physics Publishing.||2000|
|Acceptor and donor doping of AlxGa1 xN thin film alloys grown on 6H SiC(0001) substrates via metalorganic vapor phase epitaxy||Journal of Electronic Materials, 27(4), 229-232.||1998|