Publications

Showing results for "kononchuk" 1-9 of 9

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Simulation of metallic impurity gettering in silicon by MeV ion implantation Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors, and Associated Equipment, 148(1-4), 322-328. Brown, R. A., Kononchuk, O., & Rozgonyi, G. A. 1999
Evolution of deep-level centers in p-type silicon following ion implantation at 85 K Applied Physics Letters, 74(9), 1263-1265. Cho, C. R., Yarykin, N., Brown, R. A., Kononchuk, O., Rozgonyi, G. A., & Zuhr, R. A. 1999
Lateral gettering of Fe on bulk and silicon-on-insulator wafers Journal of the Electrochemical Society, 146(5), 1925-1928. Beaman, K. L., Kononchuk, O., Koveshnikov, S., Osburn, C. M., & Rozgonyi, G. A. 1999
Diffusion of iron in the silicon dioxide layer of silicon-on-insulator structures Applied Physics Letters, 73(9), 1206-1208. Kononchuk, O., Korablev, K. G., Yarykin, N., & Rozgonyi, G. A. 1999
Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61-67. Kononchuk, O., Bondarenko, I., & Rozgonyi, G. 1998
Impurity gettering to secondary defects created by MeV ion implantation in silicon Journal of Applied Physics, 84(5), 2459-2465. Brown, R. A., Kononchuk, O., Rozgonyi, G. A., Koveshnikov, S., Knights, A. P., Simpson, P. J., & Gonzalez, F. 1998
Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon Journal of the Electrochemical Society, 144(8), 2872-2881. Brown, R. A., Kononchuk, O., Bondarenko, I., Romanowski, A., Radzimski, Z. J., Rozgonyi, G. A., & Gonzalez, F. 1997
Gettering of iron in silicon on insulator wafers Applied Physics Letters, 71(8), 1107-1109. Beaman, K. L., Agarwal, A., Kononchuk, O., Koveshnikov, S., Bondarenko, I., & Rozgonyi, G. A. 1997
The effect of oxygen on secondary defect formation in MeV self-implanted silicon Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 127(1997 May), 55-58. Brown, R. A., Kononchuk, O, Radzimski, Z. J., Rozgonyi, G. A., & Gonzalez, F. 1997

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