Publications

Showing results for "griffis" 1-25 of 39 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
SIMS analysis of high-performance accelerator niobium Surface and Interface Analysis, 46, 288-290. Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., & Griffis, D. P. 2014
SIMS analysis of zinc oxide LED structures: quantification and analysis issues Surface and Interface Analysis, 45(1), 352-355. Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., & Griffis, D. P. 2013
Quantification of cesium surface contamination on silicon resulting from SIMS analysis Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(3). Penley, C., Stevie, F. A., & Griffis, D. P. 2012
Time-of-flight-secondary ion mass spectrometry method development for high-sensitivity analysis of acid dyes in nylon fibers Analytical Chemistry, 84(22), 10085-10090. Zhou, C. Z., Li, M., Garcia, R., Crawford, A., Beck, K., Hinks, D., & Griffis, D. P. 2012
Surface analysis of Nb materials for SRF cavities Surface and Interface Analysis, 43(1-2), 151-153. Maheshwari, P., Tian, H., Reece, C. E., Kelley, M. J., Myneni, G. R., Stevie, F. A., Rigsbee, J. M., Batchelor, A. D., & Griffis, D. P. 2011
Analysis of interstitial elements in niobium with secondary ion mass spectrometry (SIMS) AIP Conference Proceedings, 1352) (pp. 151-160). Maheshwari, P., Stevie, F. A., Myeneni, G., Ciovati, G., Rigsbee, J. M., & Griffis, D. P. 2011
Chemical and spatial differentiation of syringyl and guaiacyl lignins in poplar wood via time-of-flight secondary ion mass spectrometry Analytical Chemistry, 83(18), 7020-7026. Zhou, C. Z., Li, Q. Z., Chiang, V. L., Lucia, L. A., & Griffis, D. P. 2011
High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments Physical Review Special Topics. Accelerators and Beams, 13(2). Ciovati, G., Myneni, G., Stevie, F., Maheshwari, P., & Griffis, D. 2010
Focused ion beam characterization of bicomponent polymer fibers Microscopy and Microanalysis, 16(3), 282-290. Wong, K. C., Haslauer, C. M., Anantharamaiah, N., Pourdeyhimi, B., Batchelor, A. D., & Griffis, D. P. 2010
Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 28(3), 511-516. Penley, C., Stevie, F. A., Griffis, D. P., Siebel, S., Kulig, L., & Lee, J. 2010
Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam Applied Surface Science, 254(9), 2708-2711. Zhu, Z. M., Stevie, F. A., & Griffis, D. P. 2008
Quantification in dynamic SIMS: Current status and future needs Applied Surface Science, 255(4), 1364-1367. Stevie, F. A., & Griffis, D. P. 2008
Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 25(3), 480-484. Harton, S. E., Zhu, Z. M., Stevie, F. A., Griffis, D. P., & Ade, H. 2007
Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 25(4), 769-774. Zhu, Z., Gu, C., Stevie, F. A., & Griffis, D. P. 2007
Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry Microscopy and Analysis, 86, 5-6. A.D. Garetto, R.R. Garcia, A.D. Batchelor, C.L. Progl, D.P. Griffis and P.E. & Russell. 2007
Back side SIMS analysis of hafnium silicate Applied Surface Science, 252(19), 7179-7181. Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & Griffis, D. P. 2006
SIMS depth profiling of deuterium labeled polymers in polymer multilayers Applied Surface Science, 252(19), 7224-7227. Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. 2006
SIMS quantification of matrix and impurity species in AlxGa1-xN Applied Surface Science, 252(19), 7228-7231. Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. 2006
Thermal stability of lanthanum scandate dielectrics on Si(100) Applied Physics Letters, 89(24). Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., Edge, L. F., Schlom, D. G., Stevie, F. A., Garcia, R., Zhu, Z., & Griffis, D. P. 2006
Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(1), 350-354. Gu, C., Pivovarov, A., Garcia, R., Stevie, F., Griffis, D., Moran, J., Kulig, L., & Richards, J. F. 2004
Circuit editing of copper and low-k dielectrics in nanotechnology devices Journal of Microscopy, 214(2004 Jun), 246-251. Mosselveld, F., Makarov, V. V., Lundquist, T. R., Griffis, D. P., & Russell, P. E. 2004
Site-specific SIMS backside analysis Applied Surface Science, 231-232(2004 June 15), 663-667. Gu, C., Garcia, R., Pivovarov, A., Stevie, F., & Griffis, D. 2004
O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices Applied Surface Science, 231-232(2004 June 15), 684-687. Kachan, M., Hunter, J., Kouzminov, D., Pivovarov, A., Gu, J., Stevie, F., & Griffis, D. 2004
Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument Applied Surface Science, 231-232(2004 June 15), 781-785. Pivovarov, A., Gu, C., Stevie, F., & Griffis, D. 2004
Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument Applied Surface Science, 231-232(2004 June 15), 786-790. Pivovarov, A. L., Stevie, F. A., & Griffis, D. P. 2004

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