Publications

Showing results for "einfeldt" 1-25 of 25

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Surface and defect microstructure of GaN and AlN layers grown on hydrogen-etched 6H-SiC(0001) substrates Acta Materialia, 58(6), 2165-2175. Reitmeier, Z. J., Einfeldt, S., Davis, R. F., Zhang, X. Y., Fang, X. L., & Mahajan, S. 2010
Sequential growths of AlN and GaN layers on as-polished 6H-SiC(0001) substrates Acta Materialia, 57(14), 4001-4008. Reitmeier, Z. J., Einfeldt, S., Davis, R. F., Zhang, X. Y., Fang, X. L., & Mahajan, S. 2009
Characterization of growth defects in thin GaN layers with X-ray microbeam Physica Status Solidi. B, Basic Solid State Physics, 244(5), 1735-1742. Barabash, R. I., Ice, G. E., Roder, C., Budai, J., Liu, W., Figge, S., Einfeldt, S., Hommel, D., & Davis, R. F. 2007
Characterization of crystallographic properties and defects via X-ray microdiffraction in GaN (0001) layers Physica Status Solidi. A, Applications and Materials Science, 203(1), 142-148. Barabash, R. I., Barabash, O. M., Ice, G. E., Roder, C., Figge, S., & Einfeldt, S. 2006
Mapping misorientation and crystallographic tilt in GaN layers via polychromatic microdiffraction Physica Status Solidi. B, Basic Solid State Physics, 243(7), 1508-1513. Barabash, R. I., Ice, G. E., Liu, W., Roder, C., Figge, S., Einfeldt, S., Hommel, D., Katona, T. M., Speck, J. S., Denbaars, S. P., & Davis, R. F. 2006
Local strain, defects, and crystallographic tilt in GaN(0001) layers grown by maskless pendeo-epitaxy from x-ray microdiffraction Journal of Applied Physics, 97(1). Barabash, R. I., Ice, G. E., Liu, W., Einfeldt, S., Roskowski, A. M., & Davis, R. F. 2005
On the microstructure of AlxGa1-xN layers grown on 6H-SiC(0001) substrates Journal of Applied Physics, 97(8). Kroger, R., Einfeldt, S., Chierchia, R., Hommel, D., Reitmeier, Z. J., Davis, R. F., & Liu, Q. K. K. 2005
White X-ray microbeam analysis of strain and crystallographic tilt in GaN layers grown by maskless pendeoepitaxy Physica Status Solidi. A, Applications and Materials Science, 202(5), 732-738. Barabash, R. I., Ice, G. E., Liu, W., Einfeldt, S., Hommel, D., Roskowski, A. M., & Davis, R. F. 2005
Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC Physical Review. B, Condensed Matter and Materials Physics, 67(4), 045321-1. Schwarz, U. T., Schuck, P. J., Mason, M. D., Grober, R. D., Roskowski, A. M., Einfeldt, S., & Davis, R. F. 2003
Helical-type surface defects in GaN thin films epitaxially grown on GaN templates at reduced temperatures Journal of Crystal Growth, 253(1-4), 16-25. Miraglia, P. Q., Preble, E. A., Roskowski, A. M., Einfeldt, S., & Davis, R. F. 2003
Surface morphology and strain of GaN layers grown using 6H- SiC(0001) substrates with different buffer layers Journal of Crystal Growth, 253(1-4), 129-141. Einfeldt, S., Reitmeier, Z. J., & Davis, R. F. 2003
Helical-type surface defects in InGaN thin films epitaxially grown on GaN templates at reduced temperatures Thin Solid Films, 437(37623), 140-149. Miraglia, P. Q., Preble, E. A., Roskowski, A. M., Einfeldt, S., Lim, S. H., Liliental-Weber, Z., & Davis, R. F. 2003
Electrical and chemical characterization of the Schottky barrier formed between clean n-GaN(0001) surfaces and Pt, Au, and Ag Journal of Applied Physics, 94(6), 3939-3948. Tracy, K. M., Hartlieb, P. J., Einfeldt, S., Davis, R. F., Hurt, E. H., & Nemanich, R. J. 2003
Gallium nitride and related materials: challenges in materials processing Acta Materialia, 51(19), 5961-5979. Davis, R. F., Einfeldt, S., Preble, E. A., Roskowski, A. M., Reitmeier, Z. J., & Miraglia, P. Q. 2003
Strain and crystallographic tilt in uncoalesced GaN layers grown by maskless pendeoepitaxy Applied Physics Letters, 80(6), 953-955. Einfeldt, S., Roskowski, A. M., Preble, E. A., & Davis, R. F. 2002
Electron-beam-induced optical memory effects in GaN Applied Physics Letters, 80(15), 2675-2677. Chang, Y. C., Cai, A. L., Johnson, M. A. L., Muth, J. F., Kolbas, R. M., Reitmeier, Z. J., Einfeldt, S., & Davis, R. F. 2002
Maskless pendeo-epitaxial growth of GaN films Journal of Electronic Materials, 31(5), 421-428. Roskowski, A. M., Preble, E. A., Einfeldt, S., Miraglia, P. M., & Davis, R. F. 2002
Surface instability and associated roughness during conventional and pendeo-epitaxial growth of GaN(0001) films via MOVPE Journal of Crystal Growth, 241(1-2), 141-150. Roskowski, A. M., Miraglia, P. Q., Preble, E. A., Einfeldt, S., & Davis, R. F. 2002
Strain in cracked AlGaN layers Journal of Applied Physics, 92(1), 118-123. Einfeldt, S., Diesselberg, M., Heinke, H., Hommel, D., Rudloff, D., Christen, J., & Davis, R. F. 2002
Investigations regarding the maskless pendeo-epitaxial growth of GaN films prior to coalescence IEEE Journal of Quantum Electronics, 38(8), 1006-1016. Roskowski, A. M., Preble, E. A., Einfeldt, S., Miraglia, P. M., & Davis, R. F. 2002
Cross-sectional imaging of pendeo-epitaxial GaN using continuous-wave two-photon microphotoluminescence Applied Physics Letters, 81(11), 1984-1986. Schuck, P. J., Grober, R. D., Roskowski, A. M., Einfeldt, S., & Davis, R. F. 2002
Reduction in dislocation density and strain in GaN thin films grown via maskless pendeo-epitaxy Opto-electronics Review, 10(4), 261-270. Roskowski, A. M., Preble, E. A., Einfeldt, S., Miraglia, P. M., Schuck, J., Grober, R., & Davis, R. F. 2002
Infrared spectroscopic ellipsometry - a new tool for characterization of semiconductor heterostructures Vibrational Spectroscopy, 29(1-2), 121-124. Kasic, A., Schubert, M., Einfeldt, S., & Hommel, D. 2002
Optical phonons in hexagonal AlxInyGa1-x-yN (y approximate to 0.12) Physica Status Solidi. B, Basic Solid State Physics, 234(3), 970-974. Kasic, A., Schubert, M., Off, J., Scholz, F., Einfeldt, S., & Hommel, D. 2002
Strain and dislocation reduction in maskless pendeo-epitaxy GaN thin films Physica Status Solidi. A, Applications and Materials Science, 188(2), 729-732. Roskowski, A. M., Miraglia, P. Q., Preble, E. A., Einfeldt, S., Stiles, T., Davis, R. F., Schuck, J., Grober, R., & Schwarz, U. 2001

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