Showing results for "chung" 1-25 of 28 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Flexible inorganic ferroelectric thin films for nonvolatile memory devices Advanced Functional Materials, 27(21). Yu, H., Chung, C. C., Shewmon, N., Ho, S., Carpenter, J. H., Larrabee, R., Sun, T. L., Jones, J. L., Ade, H., O'Connor, B. T., & So, F. 2017
Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors Applied Physics Letters, 110(23). Lomenzo, P. D., Chung, C. C., Zhou, C. Z., Jones, J. L., & Nishida, T. 2017
Grain orientation effects on the ionic conductivity of neodymia doped ceria thin films Acta Materialia, 133, 81-89. Baure, G., Zhou, H. H., Chung, C. C., Stozhkova, M. A., Jones, J. L., & Nino, J. C. 2017
The contribution of 180 degrees domain wall motion to dielectric properties quantified from in situ X-ray diffraction Acta Materialia, 126, 36-43. Fancher, C. M., Brewer, S., Chung, C. C., Rohrig, S., Rojac, T., Esteves, G., Deluca, M., Bassiri-Gharb, N., & Jones, J. L. 2017
Temperature dependence of field-responsive mechanisms in lead zirconate titanate Journal of the American Ceramic Society, 100(9), 4352-4361. Chung, C. C., Fancher, C. M., Isaac, C., Nikkel, J., Hennig, E., & Jones, J. L. 2017
CuNb1-xTaxO3 (x <= 0.25) solid solutions: impact of Ta(V) substitution and Cu(I) deficiency on their structure, photocatalytic, and photoelectrochemical properties Zoellner, B., Stuart, S., Chung, C. C., Dougherty, D. B., Jones, J. L., & Maggard, P. A. (2016). CuNb1-xTaxO3 (x Zoellner, B., Stuart, S., Chung, C. C., Dougherty, D. B., Jones, J. L., & Maggard, P. A. 2016
Accelerated thermal decomposition of graphene oxide films in air via in situ x-ray diffraction analysis Journal of Physical Chemistry. C, 120(27), 14984-14990. Pan, Q., Chung, C. C., He, N. F., Jones, J. L., & Gao, W. 2016
Fabrication and characterization of poly(epsilon-caprolactone)/alpha-cyclodextrin pseudorotaxane nanofibers Biomacromolecules, 17(1), 271-279. Narayanan, G., Aguda, R., Hartman, M., Chung, C. C., Boy, R., Gupta, B. S., & Tonelli, A. E. 2016
Novel cellulose-collagen blend biofibers prepared from an amine/salt solvent system International Journal of Biological Macromolecules, 92, 1197-1204. Boy, R., Narayanan, G., Chung, C. C., & Kotek, R. 2016
Correlation of the stoichiometries of poly-(epsilon-caprolactone) and alpha-cyclodextrin pseudorotaxanes with their solution rheology and the molecular orientation, crystallite size, and thermomechanical properties of their nanofibers RSC Advances, 6(112), 111326-111336. Narayanan, G., Chung, C. C., Aguda, R., Boy, R., Hartman, M., Mehraban, N., Gupta, B. S., & Tonelli, A. E. 2016
Mixed Al and Si doping in ferroelectric HfO2 thin films Applied Physics Letters, 107(24). Lomenzo, P. D., Takmeel, Q., Zhou, C. Z., Chung, C. C., Moghaddam, S., Jones, J. L., & Nishida, T. 2015
The Formation of Pd Nanocrystals from Pd2(dba)3 Microcrystals Particle & Particle Systems Characterization, 30(3), 280-286. Chung, S., Leonard, D. N., Altoe, V., Aloni, S., De Yoreo, J. J., & Franzen, S. 2013
Indium incorporation in InGaN/GaN quantum wells grown on m-plane GaN substrate and c-plane sapphire Physica Status Solidi. A, Applications and Materials Science, 209(3), 559-564. Lai, K. Y., Paskova, T., Wheeler, V. D., Chung, T. Y., Grenko, J. A., Johnson, M. A. L., Udwary, K., Preble, E. A., & Evans, K. R. 2012
Roughness analysis of the critical dimension by using spectroscopic ellipsometry Journal of the Korean Physical Society, 58 5) (pp. 1426-1428). Ghong, T. H., Han, S. H., Chung, J. M., Byun, J. S., Kim, Y. D., & Aspnes, D. E. 2011
Nanoscale depth-resolved electronic properties of SiO2/SiOx/SiO2 for device-tolerant electronics Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 29(1). Katz, E. J., Zhang, Z., Hughes, H. L., Chung, K. B., Lucovsky, G., & Brillson, L. J. 2011
Nondestructive analysis of coated periodic nanostructures from optical data Optics Letters, 35(5), 733-735. Ghong, T. H., Han, S. H., Chung, J. M., Byun, J. S., Kim, T. J., Aspnes, D. E., Kim, Y. D., Park, I. H., & Kim, Y. W. 2010
Enhanced leakage current properties of Ni-doped Ba0.6Sr0.4TiO3 thin films driven by modified band edge state Journal of Applied Physics, 107(2). Seo, H., Kim, Y. B., Lucovsky, G., Kim, I. D., Chung, K. B., Kobayashi, H., & Choi, D. K. 2010
Monoclinic textured HfO2 films on GeOxNy/Ge(100) stacks using interface reconstruction by controlled thermal processing Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 28 4) (pp. 662-664). Bastos, K. P., Miotti, L., Lucovsky, G., Chung, K. B., & Nordlund, D. 2010
Instability of incorporated nitrogen in HfO2 films grown on strained Si0.7Ge0.3 layers Applied Physics Letters, 94(4). Chung, K. B., Lucovsky, G., Lee, W. J., Cho, M. H., & Jeon, H. 2009
Predeposition plasma nitridation process applied to Ge substrates to passivate interfaces between crystalline-Ge substrates and Hf-based high-K dielectrics Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 27 1) (pp. 294-299). Lucovsky, G., Long, J. P., Chung, K. B., Seo, H., Watts, B., Vasic, R., & Ulrich, M. D. 2009
Application of non-linear optical second harmonic generation and X-ray absorption and spectroscopies to defect related properties of Hf silicate and Hf Si oxynitride gate dielectrics Microelectronic Engineering, 86 7-9) (pp. 1654-1657). Gundogdu, K., Lucovsky, G., Chung, K. B., Kim, J. W., & Nordlund, D. 2009
Spectroscopic differentiation between O-atom vacancy and divacancy defects, respectively, in TiO2 and HfO2 by X-ray absorption spectroscopy Microelectronic Engineering, 86 7-9) (pp. 1676-1679). Lucovsky, G., Chung, K. B., Kim, J. W., & Norlund, D. 2009
Extrinsic interface formation of HfO2 and Al2O3/GeOx gate stacks on Ge (100) substrates Journal of Applied Physics, 106(4). Seo, H., Bellenger, F., Chung, K. B., Houssa, M., Meuris, M., Heyns, M., & Lucovsky, G. 2009
Preparation of native oxide and carbon-minimized Ge surface by NH4OH-based cleaning for high-k/Ge MOS gate stacks Journal of the Electrochemical Society, 156(11), H813-H817. Seo, H., Chung, K. B., Long, J. P., & Lucovsky, G. 2009
Thermal evolution and electrical correlation of defect states in Hf-based high-k dielectrics on n-type Ge (100): Local atomic bonding symmetry Journal of Applied Physics, 106(7). Chung, K. B., Long, J. P., Seo, H., Lucovsky, G., & Nordlund, D. 2009

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