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The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.
|Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers||Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61-67.||1998|
|Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon||Journal of the Electrochemical Society, 144(8), 2872-2881.||1997|
|Gettering of iron in silicon on insulator wafers||Applied Physics Letters, 71(8), 1107-1109.||1997|