Publications

Showing results for "Ultramicroscopy" 1-13 of 13

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Mapping 180 degrees polar domains using electron backscatter diffraction and dynamical scattering simulations Ultramicroscopy, 173, 47-51. Burch, M. J., Fancher, C. M., Patala, S., De Graef, M., & Dickey, E. C. 2017
Characterizing the response of a scintillator-based detector to single electrons Ultramicroscopy, 161, 3-9. Sang, X. H., & LeBeau, J. M. 2016
A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope Ultramicroscopy, 164, 51-61. Xu, W., Dycus, J. H., Sang, X., & LeBeau, J. M. 2016
Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy Ultramicroscopy, 168, 7-16. Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J. H., LeBeau, J. M., D'Alfonso, A. J., Allen, L. J., & Findlay, S. D. 2016
Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy Ultramicroscopy, 171, 1-7. Dycus, J. H., Xu, W., Sang, X., D'Alfonso, A. J., Chen, Z., Weyland, M., Allen, L. J., Findlay, S. D., & LeBeau, J. M. 2016
Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge Ultramicroscopy, 138, 28-35. Sang, X. H., & LeBeau, J. M. 2014
Detector non-uniformity in scanning transmission electron microscopy Ultramicroscopy, 124, 52-60. Findlay, S. D., & LeBeau, J. M. 2013
Thermal diffuse scattering in transmission electron microscopy Ultramicroscopy, 111(12), 1670-1680. Forbes, B. D., D'Alfonso, A. J., Findlay, S. D., Van Dyck, D., LeBeau, J. M., Stemmer, S., & Allen, L. J. 2011
Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale Ultramicroscopy, 106(4-5), 334-340. Kalinin, S. V., Rodriguez, B. J., Shin, J., Jesse, S., Grichko, V., Thundat, T., Baddorf, A. P., & Gruverman, A. 2006
Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiG-based, cross-sectional TEM samples Ultramicroscopy, 92(3-4), 265-271. Preble, E. A., McLean, H. A., Kiesel, S. M., Miraglia, P., Albrecht, M., & Davis, R. F. 2002
Optimization of scanning transmission X-ray microscopy for the identification and quantitation of reinforcing particles in polyurethanes Ultramicroscopy, 88(1), 33-49. Hitchcock, A. P., Koprinarov, I., Tyliszczak, T., Rightor, E. G., Mitchell, G. E., Dineen, M. T., Hayes, F., Lidy, W., Priester, R. D., Urquhart, S. G., Smith, A. P., & Ade, H. 2001
Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies Ultramicroscopy, 76(1-2), 61-67. Neves, B. R. A., Vilela, J. M. C., Russell, P. E., Reis, A. C. C., & Andrade, M. S. 1999
Precise and accurate refinements of the 220 structure factor for silicon by the systematic-row cbed method Ultramicroscopy, 69(3), 169-183. Swaminathan, S., Altynov, S., Jones, I. P., Zaluzec, N. J., Maher, D. M., & Fraser, H. L. 1997

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