Showing results for "Semiconductors and Semimetals" 1-3 of 3
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|EBIC characterization of strained Si/SiGe heterostructures||Semiconductors and Semimetals, 41(4), 402-406.||2007|
|Indium-based nitride compounds||Semiconductors and Semimetals, 50(1998), 127-166.||1998|
|Materials properties and characterization of SiC||Semiconductors and Semimetals, 52(1998), 1-20.||1998|