Publications

Showing results for "Microscopy and Analysis" 1-14 of 14

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Large area strain analysis using scanning transmission electron microscopy across multiple images Applied Physics Letters, 106(1). Oni, A. A., Sang, X., Raju, S. V., Dumpala, S., Broderick, S., Kumar, A., Sinnott, S., Saxena, S., Rajan, K., & LeBeau, J. M. 2015
Atom column indexing: Atomic resolution image analysis through a matrix representation Microscopy and Microanalysis, 20(6), 1764-1771. Sang, X. H., Oni, A. A., & LeBeau, J. M. 2014
Texture analysis of thick bismuth ferrite lead titanate layers 2014 Joint IEEE International Symposium on the Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), ) (pp. 166-168). Palizdar, M., Mallick, D., Maity, T., Roy, S., Comyn, T. P., Stevenson, T. J., Fancher, C. M., Jones, J. L., Poterala, S. F., Messing, G. L., Suvaci, E., Kleppe, A. P., Jehcoat, A. J., & Bell, A. J. 2014
Quantitative STEM: Experimental methods and applications Journal of Physics Conference Series, 371). LeBeau, J. M., Findlay, S. D., Allen, L. J., & Stemmer, S. 2012
Kelvin probe force microscopy analysis of the covalent functionalization and DNA modification of gallium phosphide nanorods Journal of Physical Chemistry. C, 116(23), 12613-12620. Richards, D. N., Zemlyanov, D. Y., & Ivanisevic, A. 2012
Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current Applied Physics Letters, 92(24). Progl, C. L., Parish, C. M., Vitarelli, J. P., & Russell, P. E. 2008
Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry Microscopy and Analysis, 86, 5-6. A.D. Garetto, R.R. Garcia, A.D. Batchelor, C.L. Progl, D.P. Griffis and P.E. & Russell. 2007
On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data Applied Physics Letters, 89(19). Parish, C. M., & Russell, P. E. 2006
Analysis of variable scale surface roughness on Si(111): a comparative Brewster angle, ellipsometry and atomic force microscopy investigation Transactions of the Institute of Metal Finishing, 83(5), 238-247. Lublow, M., & Lewerenz, H. J. 2005
Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin films by piezoresponse force microscopy Applied Physics Letters, 85(5), 795-797. Kalinin, S. V., Gruverman, A., & Bonnell, D. A. 2004
Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. (2000). Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy. In D. B. Williams & R. Shimizu (Eds.) Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. (pp. 367-368). Bristol: Institute of Physics Publishing. Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. 2000
Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures Leonard, D. N., Spontak, R. J., & Russell, P. E. (2000). Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures. In D. B. Williams & R. Shimizu (Eds.) Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000. (pp. 389-390). Bristol: Institute of Physics Publishing. Leonard, D. N., Spontak, R. J., & Russell, P. E. 2000
Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface-analysis and transmission electron-microscopy Physical Review. B, Condensed Matter and Materials Physics, 45(19), 11067-11084. Stoner, B. R., Ma, G. H. M., Wolter, S. D., & Glass, J. T. 1992
Computer-assisted microscopy the measurement and analysis of images John C. Russ. (1990). Computer-assisted microscopy the measurement and analysis of images. New York: Plenum Press. John C. Russ. 1990

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