Showing results for "Materials Characterization" 1-25 of 45 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Synthesis and optical characterization of mixed nanostructured aluminum-gallium oxy-hydroxide Materials Research Letters, 5(2), 124-127. Pearce, B. L., Berg, N. G., & Ivanisevic, A. 2017
A special twin relationship or a common Burgers misorientation between alpha plates after beta quenching in Zr alloy? Materials Characterization, 104, 61-65. Chai, L. J., Chen, B. F., Zhou, Z. M., Murty, K. L., Ma, Y. L., & Huang, W. J. 2015
Growth and characterization of high-quality, relaxed in (y) Ga1-y N templates for optoelectronic applications Journal of Electronic Materials, 44(11), 4161-4166. Van Den Broeck, D. M., Bharrat, D., Liu, Z., El-Masry, N. A., & Bedair, S. M. 2015
Effect of stacking fault energy on mechanical properties and,strengthening mechanisms of brasses processed by cryorolling Materials Characterization, 110, 14-24. Dasharath, S. M., Koch, C. C., & Mula, S. 2015
Growth and characterization of AlxGa1-xN lateral polarity structures Physica Status Solidi. A, Applications and Materials Science, 212(5), 1039-1042. Hoffmann, M. P., Kirste, R., Mita, S., Guo, W., Tweedie, J., Bobea, M., Bryan, I., Bryan, Z., Gerhold, M., Collazo, R., & Sitar, Z. 2015
In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction Journal of Materials Research, 30(3), 340-356. Esteves, G., Fancher, C. M., & Jones, J. L. 2015
Characterization of threading dislocations in pvt-grown aln substrates via x-ray topography and ray tracing simulation Journal of Electronic Materials, 43(4), 838-842. Zhou, T. Y., Raghothamachar, B., Wu, F. Z., Dalmau, R., Moody, B., Craft, S., Schlesser, R., Dudley, M., & Sitar, Z. 2014
Growth and characterization of InxGa1-xAs/GaAs1-yPy strained-Layer Superlattices with High Values of y (similar to 80%) Journal of Electronic Materials, 42(5), 912-917. Samberg, J. P., Carlin, C. Z., Bradshaw, G. K., Colter, P. C., & Bedair, S. M. 2013
Defect characterization in Ge/(001)Si epitaxial films grown by reduced-pressure chemical vapor deposition Journal of Electronic Materials, 42(10), 2888-2896. Bharathan, J., Narayan, J., Rozgonyi, G., & Bulman, G. E. 2013
Deposition and characterization of nanostructured Cu2O thin-film for potential photovoltaic applications Journal of Materials Research, 28(13), 1740-1746. Gupta, N., Singh, R., Wu, F., Narayan, J., McMillen, C., Alapatt, G. F., Poole, K. F., Hwu, S. J., Sulejmanovic, D., Young, M., Teeter, G., & Ullal, H. S. 2013
Materials characterization and mechanobiology of the eye Materials Science & Engineering. C, Biomimetic Materials, Sensors and Systems, 33(4), 1867-1875. Hugar, D. L., & Ivanisevic, A. 2013
Biomolecular gradients via semiconductor gradients: Characterization of amino acid adsorption to InxGa1-xN surfaces ACS Applied Materials & Interfaces, 5(15), 7236-7243. Bain, L. E., Jewett, S. A., Mukund, A. H., Bedair, S. M., Paskova, T. M., & Ivanisevic, A. 2013
Synthesis, characterization and mechanical behaviour of an in situ consolidated nanocrystalline FeCrNi alloy Journal of Materials Science, 47(3), 1562-1566. Gupta, R. K., Darling, K. S., Raman, R. K. S., Ravi, K. R., Koch, C. C., Murty, B. S., & Scattergood, R. O. 2012
Characterization of dislocation arrays in AlN single crystals grown by PVT Physica Status Solidi. A, Applications and Materials Science, 208(7), 1545-1547. Dalmau, R., Moody, B., Xie, J. Q., Collazo, R., & Sitar, Z. 2011
Deformation of precipitate platelets in high strength aluminum alloys under high strain-rate compression TMS 2010 139th Annual Meeting & Exhibition - Supplemental Proceedings, vol 2: Materials Characterization, Computation and Modeling and Energy, ) (pp. 47-52). Elkhodary, K., Lee, W., Cheeseman, B., Sun, L. P., Brenner, D. W., & Zikry, M. A. 2010
Processing and characterization of nanostructured Cu-carbon nanotube composites Materials Science & Engineering. A, Structural Materials: Properties, Microstructure and Processing, 523(1-2), 60-64. Li, H. Q., Misra, A., Zhu, Y. T., Horita, Z., Koch, C. C., & Holesinger, T. G. 2009
Characterization of stress rupture behavior of cornmercial-purity-Ti via burst testing Materials Science & Engineering. A, Structural Materials: Properties, Microstructure and Processing, 463(1-2), 203-207. Srikant, G., Marple, B., Charit, I., & Murty, K. L. 2007
X-ray photoelectron spectroscopy characterization of aluminum nitride surface oxides: Thermal and hydrothermal evolution Journal of Electronic Materials, 36(4), 414-419. Dalmau, R., Collazo, R., Mita, S., & Sitar, Z. 2007
Polytype stability and microstructural characterization of silicon carbide epitaxial films grown on [11(2)over bar0]- and [0001]-oriented silicon carbide substrates Journal of Electronic Materials, 36(4), 285-296. Bishop, S. M., Reynolds, C. L., Liliental-Weber, Z., Uprety, Y., Zhu, J., Wang, D., Park, M., Molstad, J. C., Barnhardt, D. E., Shrivastava, A., Sudarshan, T. S., & Davis, R. F. 2007
Characterization of crystallographic properties and defects via X-ray microdiffraction in GaN (0001) layers Physica Status Solidi. A, Applications and Materials Science, 203(1), 142-148. Barabash, R. I., Barabash, O. M., Ice, G. E., Roder, C., Figge, S., & Einfeldt, S. 2006
Emission characterization from nitrogen-doped diamond with respect to energy conversion Diamond and Related Materials, 15(2-3), 217-220. Koeck, F. A. M., & Nemanich, R. J. 2006
Characterization of bulk grown GaN and AlN single crystal materials Journal of Crystal Growth, 287(2), 349-353. Raghothamachar, B., Bai, J., Dudley, M., Dalmau, R., Zhuang, D. J., Herro, Z., Schlesser, R., Sitar, Z., Wang, B. G., Callahan, M., Rakes, K., Konkapaka, P., & Spencer, M. 2006
Growth and characterization of ZnO thin films on GaN epilayers Journal of Electronic Materials, 33(7), 826-832. Smith, T. P., McLean, H. A., Smith, D. J., Miraglia, P. Q., Roskowski, A. M., & Davis, R. F. 2004
Growth of homoepitaxial films on 4H-SiC(1120) and 8 degrees off-axis 4H-SiC(0001) substrates and their characterization Materials Science Forum, 457-460) (pp. 221-224). Utikon-Zurich, Switzerland: Trans Tech Publications. Bishop, S. M., Preble, E. A., Hallin, C., Henry, A., Storasta, L., Jacobson, H., Wagner, B. P., Reitmeier, Z., Janzen, E., & Davis, R. F. 2004
Modeling and characterization of atomically sharp "perfect" Ge/SiO2 interfaces Materials Science & Engineering. B, Solid-state Materials for Advanced Technology, 114-15(Dec 15 2004), 156-161. Windl, W., Liang, T., Lopatin, S., & Duscher, G. 2004

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