Publications

Showing results for "Journal of the Korean Physical Society" 1-20 of 20

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation Journal of the Korean Physical Society, 60(10), 1685-1689. Gokce, B., Gundogdu, K., & Aspnes, D. E. 2012
Back-reflection second-harmonic generation of (111)Si: Theory and experiment Journal of the Korean Physical Society, 58 5) (pp. 1237-1243). Gokce, B., Gundogdu, K., Adles, E. J., & Aspnes, D. E. 2011
Roughness analysis of the critical dimension by using spectroscopic ellipsometry Journal of the Korean Physical Society, 58 5) (pp. 1426-1428). Ghong, T. H., Han, S. H., Chung, J. M., Byun, J. S., Kim, Y. D., & Aspnes, D. E. 2011
Coarsening dynamics of nanoscale Ti-silicide islands on Si surfaces Journal of the Korean Physical Society, 50(3), 575-580. Yang, W. C., Zeman, M., & Nemanich, R. J. 2007
Interface analysis of an AlGaAs multilayer system by using spectroscopic ellipsometry Journal of the Korean Physical Society, 48(6), 1601-1605. Ghong, T. H., Kim, Y. D., Aspnes, D. E., Klein, M. V., Ko, D. S., Kim, Y. W., Elarde, V., & Coleman, J. 2006
Study of the dielectric function of ZnS by spectroscopic ellipsometry Journal of the Korean Physical Society, 42(2003 Feb), S238-S241. Ghong, T. H., Kim, T. J., Kim, Y. D., Kim, S. J., Aspnes, D. E., Choi, Y. D., & Yu, Y. M. 2003
Optical properties of InGaAs alloy films in the E-2 region by spectroscopic ellipsometry Journal of the Korean Physical Society, 42(2003 Feb), S242-S245. Ihn, Y. S., Ghong, T. H., Kim, Y. D., Kim, S. J., Aspnes, D. E., Yao, T., & Koo, B. H. 2003
Dielectric functions of Cd1-xMgxTe alloy films by uusing spectroscopic ellipsometry Journal of the Korean Physical Society, 43(4), 634-637. Ihn, Y. S., Kim, T. J., Kim, Y. D., Aspnes, D. E., & Kossut, J. 2003
Analysis of Ti-silicide formation with a thin Ta interlayer on Si (100) Journal of the Korean Physical Society, 40(5), 903-907. Jeon, H., Won, H., Kim, Y., Lee, J., & Nemanich, R. J. 2002
Above bandgap optical properties of ZnS and ZnS1-xTex alloys grown by using hot-wall epitaxy Journal of the Korean Physical Society, 39(3), 462-465. Bang, C. Y., Lee, M. S., Kim, T. J., Kim, Y. D., Aspnes, D. E., Yu, Y. M., O, B. S., & Choi, Y. D. 2001
Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer Journal of the Korean Physical Society, 39(2001 Dec), S372-S375. Kim, T. J., Koo, M. S., Lee, M. S., Kim, Y. D., Aspnes, D. E., & Jonker, B. T. 2001
Spectroscopic ellipsometry study of InGaAs alloy films grown on InP Journal of the Korean Physical Society, 39(2001 Dec), S389-S392. Seong, G. Y., Bang, C. Y., Kim, Y. D., Wang, J., Aspnes, D. E., Koo, B. H., & Yao, T. 2001
Dielectric function and bowing parameter of Zn1-xMgxSe and Zn1- xBexSe alloys Journal of the Korean Physical Society, 37(6), 1012-1016. Lee, H., Kim, I. Y., Powell, J., Aspnes, D. E., Lee, S., Peiris, F., & Furdyna, J. K. 2000
Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry Journal of the Korean Physical Society, 34(1999 June), S496-S498. Kim, T. J., Kim, Y. D., Yoo, S. D., Aspnes, D. E., & Kossut, J. 1999
Reduction of the transition temperature of C54TiSi(2) through a Ta interlayer Journal of the Korean Physical Society, 35(1999 Dec.), S769-S773. Jung, B., Kim, Y. D., Jeon, H., Yang, W., & Nemanich, R. J. 1999
Dielectric properties and microstructure of thin BST films Journal of the Korean Physical Society, 32 pt.4(suppl.), 1591-1594. Bilodeau, S. M., Carl, R., VanBuskirk, P. C., Roeder, J. F., Basceri, C., Lash, S. E., Parker, C. B., Streiffer, S. K., & Kingon, A. I. 1998
Electrical properties of (Ba, Sr)TiO3 thin films prepared by liquid delivery MOCVD Journal of the Korean Physical Society, 32 pt.4(suppl.), 1652-1656. Lee, W. J., Woolcott, R. R., Basceri, C., Lee, H. Y., Streiffer, S. K., Kingon, A. I., & Yang, D. Y. 1998
Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy Journal of the Korean Physical Society, 30(suppl.), 108-112. Choi, S. G., Kim, Y. D., Yoo, S. D., Aspnes, David E., Rhee, S. J., Woo, J. C., Woo, D. H., Kim, S. H., & Kang, K. N. 1997
Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs Journal of the Korean Physical Society, 31(1), 202-205. Choi, S. G., Kim, Y. D., Klein, M. V., Yoo, S. D., Aspnes, David E., Xin, S. H., & Furdyna, J. K. 1997
Above bandgap dielectric function of epitaxial ZnSe layers Journal of the Korean Physical Society, 31(4), L553-L555. Kim, Y. D., Ko, Y. D., Choi, S. G., Yoo, S. D., Aspnes, D. E., & Jonker, B. T. 1997

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