Publications

Showing results for "Journal of the Electrochemical Society" 1-25 of 57 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Oxygen electroreduction on Ti- and Fe-containing carbon fibers Journal of the Electrochemical Society, 160(8), F769-F778. McClure, J. P., Devine, C. K., Jiang, R. Z., Chu, D., Cuomo, J. J., Parsons, G. N., & Fedkiw, P. S. 2013
Solid electrolyte interphase on lithium-ion carbon nanofiber electrodes by atomic and molecular layer deposition Journal of the Electrochemical Society, 160(11), A1971-A1978. Loebl, A. J., Oldham, C. J., Devine, C. K., Gong, B., Atanasov, S. E., Parsons, G. N., & Fedkiw, P. S. 2013
Oxygen reduction on metal-free nitrogen-doped carbon nanowall electrodes Journal of the Electrochemical Society, 159(11), F733-F742. McClure, J. P., Thornton, J. D., Jiang, R. Z., Chu, D., Cuomo, J. J., & Fedkiw, P. S. 2012
Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers Journal of the Electrochemical Society, 159(2), H125-H129. Kulshreshtha, P. K., Yoon, Y., Youssef, K. M., Good, E. A., & Rozgonyi, G. 2012
Growth and characterization of AlN and AlGaN epitaxial films on AlN single crystal substrates Journal of the Electrochemical Society, 158(5), H530-H535. Dalmau, R., Moody, B., Schlesser, R., Mita, S., Xie, J., Feneberg, M., Neuschl, B., Thonke, K., Collazo, R., Rice, A., Tweedie, J., & Sitar, Z. 2011
Encapsulation and chemical resistance of electrospun nylon nanofibers coated using integrated atomic and molecular layer deposition Journal of the Electrochemical Society, 158(9), D549-D556. Oldham, C. J., Gong, B., Spagnola, J. C., Jur, J. S., Senecal, K. J., Godfrey, T. A., & Parsons, G. N. 2011
Thermal stability and performance of NbSiTaTiZr high-entropy alloy barrier for copper metallization Journal of the Electrochemical Society, 158(11), H1161-H1165. Tsai, M. H., Wang, C. W., Tsai, C. W., Shen, W. J., Yeh, J. W., Gan, J. Y., & Wu, W. W. 2011
Preparation of native oxide and carbon-minimized Ge surface by NH4OH-based cleaning for high-k/Ge MOS gate stacks Journal of the Electrochemical Society, 156(11), H813-H817. Seo, H., Chung, K. B., Long, J. P., & Lucovsky, G. 2009
Self-catalyzed hydrogenolysis of nickelocene: Functional metal coating of three-dimensional nanosystems at low temperature Journal of the Electrochemical Society, 155(9), D580-D582. Peng, Q., Spagnola, J. C., & Parsons, G. N. 2008
High-temperature stability of lanthanum silicate gate dielectric MIS devices with Ta and TaN electrodes Journal of the Electrochemical Society, 153(9), F210-F214. Lichtenwalner, D. J., Jur, J. S., Jha, R., Inoue, N., Chen, B., Misra, V., & Kingon, A. I. 2006
A comparison of thickness values for very thin SiO2 films by using ellipsometric, capacitance-voltage, and HRTEM measurements Journal of the Electrochemical Society, 153(1), F12-F19. Ehrstein, J., Richter, C., Chandler-Horowitz, D., Vogel, E., Young, C., Shah, S., Maher, D., Foran, B., Hung, P. Y., & Diebold, A. 2006
Oxygen and carbon precipitation in crystalline sheet silicon - Depth profiling by infrared spectroscopy, and preferential defect etching Journal of the Electrochemical Society, 153(11), G986-G991. Lu, J. G., & Rozgonyi, G. 2006
Electrical, structural, and chemical analysis of defects in epitaxial SiGe-based heterostructures Journal of the Electrochemical Society, 152(5), C310-C315. Bray, K. R., Zhao, W., Kordas, L., Wise, R., Robinson, M., & Rozgonyi, G. 2005
Stability of advanced gate stack devices Journal of the Electrochemical Society, 151(2), F22-F28. Kim, I., Han, S. K., & Osburn, C. M. 2004
Effect of post-metallization annealing for alternative gate stack devices Journal of the Electrochemical Society, 151(2), F29-F35. Kim, I., Han, S. K., & Osburn, C. M. 2004
Influence of additives and pulse electrodeposition parameters on production of nanocrystalline zinc from zinc chloride electrolytes Journal of the Electrochemical Society, 151(2), C103-C111. Youssef, K. M. S., Koch, C. C., & Fedkiw, P. S. 2004
The effect of interfacial layers on high-performance gate dielectrics processed by RTP-ALD Journal of the Electrochemical Society, 151(8), G507-G511. Fakhruddin, M., Singh, R., Poole, K. F., Kondapi, S. V., & Narayan, J. 2004
Local electric fields in silicided shallow junctions Journal of the Electrochemical Society, 151(9), G578-G582. Czerwinski, A., Simoen, E., Poyai, A., & Claeys, C. 2004
Structure, energetics, and thermal stability of nitrogen-vacancy-related defects in nitrogen doped silicon Journal of the Electrochemical Society, 150(12), G771-G777. Karoui, A., Karoui, F. S., Rozgonyi, G. A., Hourai, M., & Sueoka, K. 2003
Chemical, physical, and electrical characterizations of oxygen plasma assisted chemical vapor deposited yttrium oxide on silicon Journal of the Electrochemical Society, 150(5), F102-F109. Niu, D., Ashcraft, R. W., Chen, Z., Stemmer, S., & Parsons, G. N. 2003
Thermal stability of TaSixNy films deposited by reactive sputtering on SiO2 Journal of the Electrochemical Society, 150(5), F79-F82. Suh, Y. S., Heuss, G. P., Misra, V., Park, D. G., & Limb, K. Y. 2003
Electrodeposition of tin needle-like structures Journal of the Electrochemical Society, 149(3), C150-C158. Rinne, C. L., Hren, J. J., & Fedkiw, P. S. 2002
AC vs. DC bias-enhanced nucleation of highly oriented diamond on silicon (100) Journal of the Electrochemical Society, 149(2), G114-G117. Wolter, S. D., Okuzumi, F., Prater, J. T., & Sitar, Z. 2002
Growth and oxidation of thin film Al2Cu Journal of the Electrochemical Society, 148(7), B260-B263. Son, K. A., Missert, N., Barbour, J. C., Hren, J. J., Copeland, R. G., & Minor, K. G. 2001
Recovery characteristics of hydrogen-damaged (Pb,La)(Zr,Ti)O-3 capacitors with Pt and IrO2 top electrodes Journal of the Electrochemical Society, 148(7), F137-F139. Yoon, S. G., & Kingon, A. I. 2001

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