Publications

Showing results for "Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures" 1-25 of 99 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Incorporation of Be dopant in GaAs core and core-shell nanowires by molecular beam epitaxy Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 34(2). Ojha, S. K., Kasanaboina, P. K., Reynolds, C. L., Rawdanowicz, T. A., Liu, Y., White, R. M., & Iyer, S. 2016
Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 32(3). Lomenzo, P. D., Zhao, P., Takmeel, Q., Moghaddam, S., Nishida, T., Nelson, M., Fancher, C. M., Grimley, E. D., Sang, X. H., LeBeau, J. M., & Jones, J. L. 2014
Transport through singlet states in resistive memory materials: Magneli-phase, TinO2n-1 for 9 >= n > 3, and TiO2-HfO2 alloys Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 31(1). Lucovsky, G., & Kim, J. 2013
Noncrystalline SiO2 and GeO2: Process induced pre-existing defects and vacated O-atom intrinsic bonding sites Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 31(1). Lucovsky, G., Kim, J., Wu, K., & Zeller, D. 2013
Smooth MgO films grown on graphite and graphene by pulsed laser deposition Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 31(5). Stuart, S. C., Satchet, E., Sandin, A., Maria, J. P., Rowe, J. E., Dougherty, D. B., & Ulrich, M. 2013
Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)-Si by spectroscopic ellipsometry, Auger spectroscopy, and STM Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(4). Nelson, F., Sandin, A., Dougherty, D. B., Aspnes, D. E., Rowe, J. E., & Diebold, A. C. 2012
Quantification of cesium surface contamination on silicon resulting from SIMS analysis Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(3). Penley, C., Stevie, F. A., & Griffis, D. P. 2012
O-vacancies in (i) nanocrystalline HfO2 and (i) noncrystalline SiO2 and Si3N4 studied by x-ray absorption spectroscopy Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 29(1). Lucovsky, G., Miotti, L., & Bastos, K. P. 2011
Spectroscopic detection of hopping induced mixed valence for Ti and Sc in GdSc1-xTixO3 for x greater than the percolation threshold of similar to 0.16 Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 29(1). Lucovsky, G., Miotti, L., Bastos, K. P., Adamo, C., & Schlom, D. G. 2011
Nanoscale depth-resolved electronic properties of SiO2/SiOx/SiO2 for device-tolerant electronics Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 29(1). Katz, E. J., Zhang, Z., Hughes, H. L., Chung, K. B., Lucovsky, G., & Brillson, L. J. 2011
Study of molecular beam epitaxially grown InGaAsSbN/GaSb single quantum wells Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 29(3). Bharatan, S., Iyer, S., Li, J., Rawdanowicz, T. A., & Reynolds, L. 2011
Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 28(3), 511-516. Penley, C., Stevie, F. A., Griffis, D. P., Siebel, S., Kulig, L., & Lee, J. 2010
Predeposition plasma nitridation process applied to Ge substrates to passivate interfaces between crystalline-Ge substrates and Hf-based high-K dielectrics Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 27 1) (pp. 294-299). Lucovsky, G., Long, J. P., Chung, K. B., Seo, H., Watts, B., Vasic, R., & Ulrich, M. D. 2009
Theory of space charge limited regime of thermionic energy converter with negative electron affinity emitter Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 27(3), 1132-1141. Smith, J. R., Bilbro, G. L., & Nemanich, R. J. 2009
Low energy electron-excited nanoscale luminescence spectroscopy studies of intrinsic defects in HfO2 and SiO2-HfO2-SiO2-Si stacks Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(1), 232-243. Strzhemechny, Y. M., Bataiev, M., Tumakha, S. P., Goss, S. H., Hinkle, C. L., Fulton, C. C., Lucovsky, G., & Brillson, L. J. 2008
Single molecule measurements with photoelectron emission microscopy Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(4), 1461-1465. Kong, X. H., Rowe, J. E., & Nemanich, R. J. 2008
Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26 6) (pp. 2168-2173). Dhawan, A., Muth, J. F., Leonard, D. N., Gerhold, M. D., Gleeson, J., Vo-Dinh, T., & Russell, P. E. 2008
Conformal metal oxide coatings on nanotubes by direct low temperature metal-organic pyrolysis in supercritical carbon dioxide Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(3), 978-982. Peng, Q., Spagnola, J. C., Daisuke, H., Park, K. J., & Parsons, G. N. 2008
Fabrication of Ag-tetracyanoquinodimethane nanostructures using ink-jet printing/vapor-solid chemical reaction process Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(6), L48-L52. Aggarwal, R., Narayan, R. J., Xiao, K., & Geohegan, D. B. 2008
Improved epitaxy of barium titanate by molecular beam epitaxy through a single crystalline magnesium oxide template for integration on hexagonal silicon carbide Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(3), 1110-1114. Goodrich, T. L., Cai, Z., Losego, M. D., Maria, J. P., Kourkoutis, L. F., Muller, D. A., & Ziemer, K. S. 2008
Initial stages of GaP heteroepitaxy on nanoscopically roughened (001)SI Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 25(4), 1448-1452. Liu, X., Kim, I. K., & Aspnes, D. E. 2007
Epitaxial calcium oxide films deposited on gallium nitride surfaces Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 25(3), 1029-1032. Losego, M. D., Mita, S., Collazo, R., Sitar, Z., & Maria, J. P. 2007
Thin, crystalline MgO on hexagonal 6H-SIC(0001) by molecular beam epitaxy for functional oxide integration Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 25(3), 1033-1038. Goodrich, T. L., Cai, Z., Losego, M. D., Maria, J. P., & Ziemer, K. S. 2007
Comparison of ultrathin SiO2/Si(100) and SiO2/Si(111) interfaces from soft x-ray photoelectron spectroscopy Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 24(4), 2132-2137. Ulrich, M. D., Rowe, J. E., Keister, J., Niimi, H., Fleming, L., & Lucovsky, G. 2006
Molecular beam epitaxy of Sm2O3, Dy2O3, and Ho2O3 on Si (111) Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 24(4), 2105-2110. Craft, H. S., Collazo, R., Sitar, Z., & Maria, J. P. 2006

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