Publications

Showing results for "Journal of Microscopy" 1-25 of 31 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Domain imaging in ferroelectric thin films via channeling-contrast backscattered electron microscopy Journal of Materials Science, 52(2), 1071-1081. Ihlefeld, J. F., Michael, J. R., McKenzie, B. B., Scrymgeour, D. A., Maria, J. P., Paisley, E. A., & Kitahara, A. R. 2017
Quantitative STEM: Experimental methods and applications Journal of Physics Conference Series, 371). LeBeau, J. M., Findlay, S. D., Allen, L. J., & Stemmer, S. 2012
Kelvin probe force microscopy analysis of the covalent functionalization and DNA modification of gallium phosphide nanorods Journal of Physical Chemistry. C, 116(23), 12613-12620. Richards, D. N., Zemlyanov, D. Y., & Ivanisevic, A. 2012
Conducting atomic force microscopy studies of nanoscale cobalt silicide Schottky barriers on Si(111) and Si(100) Journal of Applied Physics, 105(8). Tedesco, J. L., Rowe, J. E., & Nemanich, R. J. 2009
Single molecule measurements with photoelectron emission microscopy Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 26(4), 1461-1465. Kong, X. H., Rowe, J. E., & Nemanich, R. J. 2008
Transmission electron microscopy observations on the microstructure of naturally aged Al-Mg-Si alloy AA6022 processed with an electric field Journal of Materials Science, 41(22), 7555-7561. Conrad, H., Ramachandran, S., Jung, K., & Narayan, J. 2006
Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission microscopy Journal of Applied Physics, 99(2). Zeman, M. C., Fulton, C. C., Lucovsky, G., Nemanich, R. J., & Yang, W. C. 2006
Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission microscopy (vol 99, pg 023519, 2006) Journal of Applied Physics, 99(10). Zeman, M. C., Fulton, C. C., Lucovsky, G., Nemanich, R. J., & Yang, W. C. 2006
Electromechanical imaging of biomaterials by scanning probe microscopy Journal of Structural Biology, 153(2), 151-159. Rodriguez, B. J., Kalinin, S. V., Shin, J., Jesse, S., Grichko, V., Thundat, T., Baddorf, A. P., & Gruverman, A. 2006
Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics Journal of Materials Science, 41(1), 107-116. Gruverman, A., & Kalinin, S. V. 2006
Photo electron emission microscopy of polarity-patterned materials Journal of Physics. Condensed Matter, 17(16), S1415-S1426. Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. 2005
Transmission electron microscopy studies of the bonded SiC-SiC interface Journal of Materials Science, 40(16), 4369-4371. Yushin, G. N., Kvit, A. V., & Sitar, Z. 2005
Nanoelectromechanics of polarization switching in piezoresponse force microscopy Journal of Applied Physics, 97(7). Kalinin, S. V., Gruverman, A., Rodriguez, B. J., Shin, J., Baddorf, A. P., Karapetian, E., & Kachanov, M. 2005
Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(5), 2102-2108. Shin, J., Rodriguez, B. J., Baddorf, A. P., Thundat, T., Karapetian, E., Kachanov, M., Gruverman, A., & Kalinin, S. V. 2005
Circuit editing of copper and low-k dielectrics in nanotechnology devices Journal of Microscopy, 214(2004 Jun), 246-251. Mosselveld, F., Makarov, V. V., Lundquist, T. R., Griffis, D. P., & Russell, P. E. 2004
Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy Journal of Applied Physics, 95(4), 1958-1962. Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Cross, J. S. 2004
Photoionization threshold of eumelanosomes determined using UV free electron laser - Photoelectron emission microscopy Journal of Physical Chemistry. B, Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, 108(42), 16334-16338. Samokhvalov, A., Garguilo, J., Yang, W. C., Edwards, G. S., Nemanich, R. J., & Simon, J. D. 2004
Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures Journal of Applied Physics, 94(9), 5720-5725. Yang, W. C., Rodriguez, B. J., Park, M., Nemanich, R. J., Ambacher, O., & Cimalla, V. 2003
Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures Microelectronics Journal, 34(5-8), 571-573. Da Silva, M. I. N., Gonzalez, J. C., & Russell, P. E. 2003
Aberration-corrected scanning transmission electron microscopy: the potential for nano- and interface science Zeitschrift fur MetallkundeAmerican Journal of Physiology, 94(4), 350-357. Pennycook, S. J., Lupini, A. R., Kadavanich, A., Mcbride, J. R., Rosenthal, S. J., Puetter, R. C., Yahil, A., Krivanek, O. L., Dellby, N., Nellist, P. D. L., Duscher, G., Wang, L. G., & Pantelides, S. T. 2003
Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials Journal of Crystal Growth, 246(3-4), 252-258. Rodriguez, B. J., Gruverman, A., Kingon, A. I., & Nemanich, R. J. 2002
Current-voltage and imaging of TiSi2 islands on Si(001) surfaces using conductive-tip atomic force microscopy Journal of Applied Physics, 92(6), 3326-3331. Oh, J., & Nemanich, R. J. 2002
Relaxation of InGaN thin layers observed by x-ray and transmission electron microscopy studies Journal of Electronic Materials, 30(4), 439-444. Liliental-Weber, Z., Benamara, M., Washburn, J., Domagala, J. Z., Bak-Misiuk, J., Piner, E. L., Roberts, J. C., & Bedair, S. M. 2001
Near-edge X-ray absorption fine structure (NEXAFS) microscopy of a polycarbonate/poly (acrylonitrile/butadiene/styrene) blend Journal of Polymer Science. Part B, Polymer Physics, 39(5), 531-535. Sloop, C. C., Ade, H., Fornes, R. E., Gilbert, R. D., & Smith, A. P. 2001
Spatial variation of ferroelectric properties in Pb(Zr-0.3, Ti- 0.7)O-3 thin films studied by atomic force microscopy Journal of Applied Physics, 87(11), 8031-8034. Christman, J. A., Kim, S. H., Maiwa, H., Maria, J. P., Rodriguez, B. J., Kingon, A. I., & Nemanich, R. J. 2000

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