Showing results for "International Conference on Ultimate Integration on Silicon" 1-2 of 2
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|Qualitative and quantitative differences between non-crystalline and nano-crystalline oxides in device technologies||International Conference on Ultimate Integration on Silicon, ) (pp. 174-177).||2013|
|Nano-scale order in hydrogenated amorphous silicon a-Si,H and doped a-Si(H) defect reduction for device applications||International Conference on Ultimate Integration on Silicon, ) (pp. 217-220).||2013|