Publications

Showing results for "Interface Science" 1-25 of 33 Next

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Interface thermal conductance between metal films and copper Metallurgical and Materials Transactions. A, Physical Metallurgy and Materials Science, 45A(5), 2480-2486. Zheng, H., & Jagannadham, K. 2014
Fractal analysis of the role of the rough interface between Bi2Sr2CaCu2Ox filaments and the Ag matrix in the mechanical behavior of composite round wires Superconductor Science & Technology, 26(5). Gou, X. F., & Schwartz, J. 2013
Monoclinic textured HfO2 films on GeOxNy/Ge(100) stacks using interface reconstruction by controlled thermal processing Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 28 4) (pp. 662-664). Bastos, K. P., Miotti, L., Lucovsky, G., Chung, K. B., & Nordlund, D. 2010
Analysis of interface layers by spectroscopic ellipsometry Applied Surface Science, 255(3), 640-642. Kim, T. J., Yoon, J. J., Kim, Y. D., Aspnes, D. E., Klein, M. V., Ko, D. S., Kim, Y. W., Elarde, V. C., & Coleman, J. J. 2008
Transmission electron microscopy studies of the bonded SiC-SiC interface Journal of Materials Science, 40(16), 4369-4371. Yushin, G. N., Kvit, A. V., & Sitar, Z. 2005
Short-beam three-point bend test study in syntactic foam. Part III: Effects of interface modification on strength and fractographic features Journal of Applied Polymer Science, 98(2), 687-693. Kishore, Shankar, R., & Sankaran, S. 2005
Spectroscopic characterization of high k dielectrics: Applications to interface electronic structure and stability against chemical phase separation Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 22(4), 1301-1308. Krug, C., & Lucovsky, G. 2004
Reductions in interface defects, D-it, by post-oxidation plasma-assisted nitridation of GaN-SiO2 interfaces in MOS devices Applied Surface Science, 234(37990), 475-479. Bae, C., & Lucovsky, G. 2004
Interfacial strain-induced self-organization in semiconductor dielectric gate stacks. I. Strain relief at the Si-SiO2 interface Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2087-2096. Lucovsky, G., & Phillips, J. C. 2004
Reductions in interface defects, D-it, by post oxidation plasma-assisted nitridation of GaN-SiO2 interfaces in MOS devices Surface Science, 566(Sep 20 2004), 356-360. Bae, C., & Lucovsky, G. 2004
Bulk and interface charge in low temperature silicon nitride for thin film transistors on plastic substrates Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 22(6), 2256-2260. Park, K. J., & Parsons, G. N. 2004
Copper segregation to the Sigma 5 (310)/[001] symmetric tilt grain boundary in aluminum Interface Science, 12(03-Feb), 165-174. Campbell, G. H., Plitzko, J. M., King, W. E., Foiles, S. M., Kisielowski, C., & Duscher, G. J. M. 2004
On the origin and energy of triple junction defects due to the finite length of grain boundaries Interface Science, 11(4), 417-424. Nazarov, A. A., Bachurin, D. V., Shenderova, O. A., & Brenner, D. W. 2003
Physical organogels composed of amphiphilic block copolymers and 1,3:2,4-dibenzylidene-D-sorbitol Journal of Colloid and Interface Science, 267(2), 509-518. Wilder, E. A., Hall, C. K., & Spontak, R. J. 2003
Aberration-corrected scanning transmission electron microscopy: the potential for nano- and interface science Zeitschrift fur MetallkundeAmerican Journal of Physiology, 94(4), 350-357. Pennycook, S. J., Lupini, A. R., Kadavanich, A., Mcbride, J. R., Rosenthal, S. J., Puetter, R. C., Yahil, A., Krivanek, O. L., Dellby, N., Nellist, P. D. L., Duscher, G., Wang, L. G., & Pantelides, S. T. 2003
Fixed charge and interface traps at heterovalent interfaces between Si(100) and non-crystalline Al2O3-Ta2O5 alloys Applied Surface Science, 190(1-4), 43-47. Johnson, R. S., Lucovsky, G., & Hong, J. G. 2002
Electronic states at the interface of Ti-Si oxide on Si(100) Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1726-1731. Fulton, C. C., Lucovsky, G., & Nemanich, R. J. 2002
Interface electronic structure of Ta2O5-Al2O3 alloys for Si- field-effect transistor gate dielectric applications Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1732-1738. Ulrich, M. D., Johnson, R. S., Hong, J. G., Rowe, J. E., Lucovsky, G., Quinton, J. S., & Madey, T. E. 2002
Effects of surface pretreatments on interface structure during formation of ultra-thin yttrium silicate dielectric films on silicon Applied Surface Science, 181(1-2), 78-93. Chambers, J. J., Busch, B. W., Schulte, W. H., Gustafsson, T., Garfunkel, E., Wang, S., Maher, D. M., Klein, T. M., & Parsons, G. N. 2001
Separate and independent reductions in direct tunneling in oxide/nitride stacks with monolayer interface nitridation associated with the (i) interface nitridation and (ii) increased physical thickness Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1163-1168. Lucovsky, G., Wu, Y., Niimi, H., Yang, H., Keister, J., & Rowe, J. E. 2000
Independent interface and bulk film contributions to reduction of tunneling currents in stacked oxide/nitride gate dielectrics with monolayer nitrided interfaces Applied Surface Science, 159(2000 June), 50-61. Lucovsky, G., Niimi, H., Wu, Y., & Yang, H. 2000
Grain boundaries in barium strontium titanate thin films: Structure, chemistry and influence on electronic properties Interface Science, 8(2-3), 209-221. Stemmer, S., Streiffer, S. K., Browning, N. D., Basceri, C., & Kingon, A. I. 2000
Thermoplastic elastomers: fundamentals and applications Current Opinion in Colloid & Interface Science, 5(5-6), 334-341. Spontak, R. J., & Patel, N. P. 2000
Solvent-regulated ordering in block copolymers Current Opinion in Colloid & Interface Science, 4(2), 130-139. Alexandridis, P., & Spontak, R. J. 1999
Advances in self-ordering macromolecules and nanostructure design Current Opinion in Colloid & Interface Science, 4(2), 140-146. Spontak, R. J., & Alexandridis, P. 1999

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