Publications

Showing results for "IEEE Transactions on Nuclear Science" 1-6 of 6

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Total dose and bias temperature stress effects for HfSiON on Si MOS capacitors IEEE Transactions on Nuclear Science, 54(6), 1931-1937. Chen, D. K., Mamouni, E. E., Zhou, X. J., Schrimpf, R. D., Fleetwood, D. M., Galloway, K. F., Lee, S., Seo, H., Lucovsky, G., Jun, B., & Cressler, J. D. 2007
Differences between charge trapping states in irradiated nano-crystalline HfO2 and non-crystalline Hf silicates IEEE Transactions on Nuclear Science, 53(6), 3644-3648. Lucovsky, G., Fleetwood, D. M., Lee, S., Seo, H., Schrimpf, R. D., Felix, J. A., Luning, J., Fleming, L. B., Ulrich, M., & Aspnes, D. E. 2006
Long-term reliability degradation of ultrathin dielectric films due to heavy-ion irradiation IEEE Transactions on Nuclear Science, 49(6), 3045-3050. Choi, B. K., Fleetwood, D. M., Schrimpf, R. D., Massengill, L. W., Galloway, K. F., Shaneyfelt, M. R., Meisenheimer, T. L., Dodd, P. E., Schwank, J. R., Lee, Y. M., John, R. S., & Lucovsky, G. 2002
Total-dose radiation response of hafnium-silicate capacitors IEEE Transactions on Nuclear Science, 49(6), 3191-3196. Felix, J. A., Fleetwood, D. M., Schrimpf, R. D., Hong, J. G., Lucovsky, G., Schwank, J. R., & Shaneyfelt, M. R. 2002
Heavy-ion-induced breakdown in ultra-thin gate oxides and high- k dielectrics IEEE Transactions on Nuclear Science, 48(6), 1904-1912. Massengill, L. W., Choi, B. K., Fleetwood, D. M., Schrimpf, R. D., Galloway, K. F., Shaneyfelt, M. R., Meisenheimer, T. L., Dodd, P. E., Schwank, J. R., Lee, Y. M., Johnson, R. S., & Lucovsky, G. 2001
Low energy electron-excited nanoscale luminescence: A tool to detect trap activation by ionizing radiation IEEE Transactions on Nuclear Science, 47(6), 2276-2280. White, B. D., Brillson, L. J., Lee, S. C., Fleetwood, D. M., Schrimpf, R. D., Pantelides, S. T., Lee, Y. M., & Lucovsky, G. 2000

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