Publications

Showing results for "IEEE Transactions on Device and Materials Reliability" 1-1 of 1

The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.

Title Journal Year
Conduction band-edge states associated with the removal of d-state degeneracies by the Jahn-Teller effect IEEE Transactions on Device and Materials Reliability, 5(1), 65-83. Lucovsky, G., Fulton, C. C., Zhang, Y., Zou, Y., Luning, J., Edge, L. F., Whitten, J. L., Nemanich, R. J., Ade, H., Schlom, D. G., Afanase'v, V. V., Stesmans, A., Zollner, S., Triyoso, D., & Rogers, B. R. 2005

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