Showing results for "IEEE Transactions on Device and Materials Reliability" 1-1 of 1
The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.
|Conduction band-edge states associated with the removal of d-state degeneracies by the Jahn-Teller effect||IEEE Transactions on Device and Materials Reliability, 5(1), 65-83.||2005|