Showing results for "Electronics Letters" 1-4 of 4
The publications on this page are generated nightly from the NCSU Library's Scholarly Publications Repository. This repository is by no means a fully comprehensive listing of publications. Publications can be added to the repository manually by visiting the Publications Repository Submission Form.
|Electronic high temperature characteristics of AlN||Electronics Letters, 43(10), 592-594.||2007|
|High-kappa gate dielectrics with ultra-low leakage current for sub-45 nm CMOS||Electronics Letters, 43(21), 1130-1132.||2007|
|Influence of Zn doping profiles on excitation dependence of photoluminescence intensity in InGaAsP heterostructures||Electronics Letters, 41(18), 1008-1010.||2005|
|Reliability degradation of ultra-thin oxynitride and Al2O3 gate dielectric films owing to heavy-ion irradiation||Electronics Letters, 38(4), 157-158.||2002|