Welcome >>

Titan microscope

Caption: Probe corrected FEI Titan 60-300 kV at NCSU.

As scaling continues to be a major drive of research, future developments rely upon electron microscopy to probe the nature of material properties. In the nano-regime, one must explore local atomic structure, chemical composition, and bonding with ultimate spatial resolution. Now that aberration corrected microscopes have blown past the Ångström in resolution, a new level of clarity is available for exploring next-generation materials.

Research Interests

  • Application of aberration-corrected electron microscopy
  • Understanding material properties from the atomic structure
  • Reconstruction at the interface between dissimilar materials
  • Quantitative atomic resolution microscopy imaging and diffraction
  • Three dimensional imaging of materials
  • Image processing and analysis techniques

Recent Publications >>

  1. X. Sang, E. D. Grimley, C. Niu, D. L. Irving, and J. M. LeBeauDirect observation of charge mediated lattice distortions in complex oxide solid solutionsApplied Physics Letters106:061913  (2015)
  2. A. A. Oni, X. Sang, S. V. Raju, S. Dumpala, S. Broderick, A. Kumar, S. Sinnott, S. Saxena, K. Rajan, and J. M. LeBeauLarge area strain analysis using scanning transmission electron microscopy across multiple imagesApplied Physics Letters106:011601  (2015)
  3. S. V. Raju, A. A. Oni, B. K. Godwal, J. Yan, V. Drozd, S. Srinivasan, J. M. LeBeau, K. Rajan, and S. K. SaxenaEffect of B and Cr on elastic strength and crystal structure of Ni3Al alloys under high pressureJournal of Alloys and Compounds619:616--620  (2015)