Welcome >>

Titan microscope

Caption: Probe corrected FEI Titan 60-300 kV at NCSU.

As scaling continues to be a major drive of research, future developments rely upon electron microscopy to probe the nature of material properties. In the nano-regime, one must explore local atomic structure, chemical composition, and bonding with ultimate spatial resolution. Now that aberration corrected microscopes have blown past the Ångström in resolution, a new level of clarity is available for exploring next-generation materials.

Research Interests

  • Application of aberration-corrected electron microscopy
  • Understanding material properties from the atomic structure
  • Reconstruction at the interface between dissimilar materials
  • Quantitative atomic resolution microscopy imaging and diffraction
  • Three dimensional imaging of materials
  • Image processing and analysis techniques

Recent Publications >>

  1. J. H. Dycus, J. S. Harris, X. Sang, C. M. Fancher, S. D. Findlay, A. A. Oni, T. E. Chan, C. C. Koch, J. L. Jones, L. J. Allen, D. L. Irving, and J. M. LeBeauAccurate nanoscale crystallography in real-space using scanning transmission electron microscopyMicroscopy and Microanalysis21:946-952  (2015)
  2. C. Eaton, J. A. Moyer, H. M. Alipour, E. D. Grimley, M. Brahlek, J. M. LeBeau, and R. Engel-HerbertGrowth of SrVO3 thin films by hybrid molecular beam epitaxyJournal of Vacuum Science \& Technology A33:061504  (2015)
  3. J. L. Jones, J. M. LeBeau, J. Nikkel, A. A. Oni, J. H. Dycus, C. Cozzan, F.-Y. Lin, A. Chernatynskiy, J. C. Nino, S. B. Sinnott, S. Mhin, G. L. Brennecka, and J. IhlefeldCombined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin FilmsAdvanced Materials Interfaces2:1500181  (2015)
  4. C. Niu, A. J. Zaddach, A. A. Oni, X. Sang, J. W. Hurt, J. M. LeBeau, C. C. Koch, and D. L. IrvingSpin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCoApplied Physics Letters106:161906  (2015)
  5. A. A. Oni, X. Sang, S. V. Raju, S. Dumpala, S. Broderick, A. Kumar, S. Sinnott, S. Saxena, K. Rajan, and J. M. LeBeauLarge area strain analysis using scanning transmission electron microscopy across multiple imagesApplied Physics Letters106:011601  (2015)
  6. X. Sang, E. D. Grimley, T. Schenk, U. Schroeder, and J. M. LeBeauOn the Structural Origins of Ferroelectricity in HfO2 Thin FilmsApplied Physics Letters106:162905  (2015)
  7. X. Sang, E. D. Grimley, C. Niu, D. L. Irving, and J. M. LeBeauDirect observation of charge mediated lattice distortions in complex oxide solid solutionsApplied Physics Letters106:061913  (2015)