Welcome >>

Titan microscope

Caption: Probe corrected FEI Titan 60-300 kV at NCSU.

As scaling continues to be a major drive of research, future developments rely upon electron microscopy to probe the nature of material properties. In the nano-regime, one must explore local atomic structure, chemical composition, and bonding with ultimate spatial resolution. Now that aberration corrected microscopes have blown past the Ångström in resolution, a new level of clarity is available for exploring next-generation materials.

Research Interests

  • Application of aberration-corrected electron microscopy
  • Understanding material properties from the atomic structure
  • Reconstruction at the interface between dissimilar materials
  • Quantitative atomic resolution microscopy imaging and diffraction
  • Three dimensional imaging of materials
  • Image processing and analysis techniques

Group Openings >>

The LeBeau research group in the Department of Materials Science & Engineering at North Carolina State University is seeking a postdoctoral research associate to start December 2015. The post-doc will be responsible for the development of quantitative imaging and spectroscopy at the atomic scale using aberration corrected scanning transmission electron microscopy. Studies will include a wide range of materials, for example functional oxide-nitride interfaces and state-of-the-art alloys. These efforts will account for 70% of the post-doc’s responsibilities.

The remaining 30% of the post-docs responsibilities will be to oversee training of students/researchers and research collaborations on the Titan microscope. The post-doc will train users to operate the microscopy safely and independently, will help develop facility policies for user training and oversight, and will perform periodic service work for internal and external clients. The post-doc will also contribute to developing the internal and external user bases by presenting highlights of research on the websites and throughout campus, by providing tours to potential users, and by giving presentations at national and international meetings.

NCSU has an aberration corrected microscope for ultra-high resolution STEM imaging and chemical analysis. Other equipment includes a JEOL 2010 STEM/TEM, several conventional TEMs, and a FIB. The position requires a Ph. D. in materials science or a related field. Experience with aberration corrected STEM is desired. Duration is between 1-3 years and salary is commensurate with qualifications.

Interested candidates should apply online here:


AA/EEO. In addition, NC State welcomes all persons without regard to sexual orientation.

Recent Publications >>

  1. J. H. Dycus, J. S. Harris, X. Sang, C. M. Fancher, S. D. Findlay, A. A. Oni, T. E. Chan, C. C. Koch, J. L. Jones, L. J. Allen, D. L. Irving, and J. M. LeBeauAccurate nanoscale crystallography in real-space using scanning transmission electron microscopyMicroscopy and Microanalysis21:946-952  (2015)
  2. C. Eaton, J. A. Moyer, H. M. Alipour, E. D. Grimley, M. Brahlek, J. M. LeBeau, and R. Engel-HerbertGrowth of SrVO3 thin films by hybrid molecular beam epitaxyJournal of Vacuum Science \& Technology A33:061504  (2015)
  3. J. L. Jones, J. M. LeBeau, J. Nikkel, A. A. Oni, J. H. Dycus, C. Cozzan, F.-Y. Lin, A. Chernatynskiy, J. C. Nino, S. B. Sinnott, S. Mhin, G. L. Brennecka, and J. IhlefeldCombined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin FilmsAdvanced Materials Interfaces2:1500181  (2015)
  4. C. Niu, A. J. Zaddach, A. A. Oni, X. Sang, J. W. Hurt, J. M. LeBeau, C. C. Koch, and D. L. IrvingSpin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCoApplied Physics Letters106:161906  (2015)
  5. A. A. Oni, X. Sang, S. V. Raju, S. Dumpala, S. Broderick, A. Kumar, S. Sinnott, S. Saxena, K. Rajan, and J. M. LeBeauLarge area strain analysis using scanning transmission electron microscopy across multiple imagesApplied Physics Letters106:011601  (2015)
  6. X. Sang, E. D. Grimley, T. Schenk, U. Schroeder, and J. M. LeBeauOn the Structural Origins of Ferroelectricity in HfO2 Thin FilmsApplied Physics Letters106:162905  (2015)
  7. X. Sang, E. D. Grimley, C. Niu, D. L. Irving, and J. M. LeBeauDirect observation of charge mediated lattice distortions in complex oxide solid solutionsApplied Physics Letters106:061913  (2015)