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Methods
Transmission Electron Microscopy
Conventional Transmission Electron Microsocpy
- Brightfield - Darkfield Imaging
- Weak Beam Imaging
- High Resolution (Phase Contrast) Imaging
Electron Diffraction
- Selected Area Diffraction
- Convergent Beam Electron Diffraction
Instruments
- TEM Topcon O2B at NCSU
- TEM/STEM JEOL 2010F at NCSU
- dedicated STEM VG501 UX with Nion Aberration Corrector at ORNL
- dedicated STEM VG603 U with Nion Aberration Corrector at ORNL
Materials Simulations
- Ab Initio Density Functional Theory
- Finite Element Calculations
Sample Preparation
Cleaving Method
- Conventional Method
- Nanomaterials
- Focused Ion Beam (FIB)
